A high-resolution electron microscopy study of steps on lamellar γ-α2interfaces in a low-misfit TiAl-based alloy

Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

Volumn 79, Issue 10, 1999, Pages 2553-2575

  Shang, P ^a   Cheng, T T ^a   Aindow, M ^a  

^a UNIVERSITY OF BIRMINGHAM   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038929221     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418619908214299     Document Type: Article

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