메뉴 건너뛰기




Volumn 27, Issue 3, 2003, Pages 219-224

Variation in thickness of copper films deposited at various distances and angles using the thermionic vacuum arc

Author keywords

Anodic vacuum arc; Copper vapor plasma; Deposition; Thickness

Indexed keywords

ADHESION; DEPOSITION; ELECTRON BEAMS; POSITIVE IONS;

EID: 0038749428     PISSN: 13000101     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (3)

References (25)
  • 10
    • 0038210891 scopus 로고    scopus 로고
    • U.S. Patent No: 4 448 802, (1984)
    • R. Buhl, E. Moll, and H. Daxinger, U.S. Patent No: 4 448 802, (1984).
    • Buhl, R.1    Moll, E.2    Daxinger, H.3
  • 11
    • 0037535535 scopus 로고    scopus 로고
    • French Patent No: 1 496 697, (1967)
    • H.J. Hamilton, French Patent No: 1 496 697, (1967).
    • Hamilton, H.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.