Preparation and properties of PLZT thick films on silicon

Materials Science and Engineering: B

Volumn 99, Issue 1-3, 2003, Pages 195-198

  Zhao, Hong Jin ^a   Ren, Tian Ling ^a   Zhang, Ning Xin ^a   Zuo, Ru Zhong ^a   Wang, Xiao Hui ^a   Liu, Li Tian ^a   Li, Zhi Jian ^a   Gui, Zhi Lun ^a   Li, Long Tu ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

High frequency properties; PLZT; Screen printing; Thick films

Indexed keywords

COERCIVE FORCE; CRYSTAL ORIENTATION; DIELECTRIC LOSSES; FERROELECTRIC MATERIALS; FILM PREPARATION; HYSTERESIS; MICROELECTROMECHANICAL DEVICES; MOBILE TELECOMMUNICATION SYSTEMS; PERMITTIVITY; PEROVSKITE; POLARIZATION; SCREEN PRINTING; SILICA; THICK FILMS; X RAY DIFFRACTION ANALYSIS;

PHASE CHARACTERIZATION;

LEAD COMPOUNDS;

EID: 0038715730     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(02)00518-4     Document Type: Conference Paper

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