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Volumn 2, Issue , 2001, Pages 1171-1175
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Thermal cycling aging effects on solder joint properties
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Author keywords
Microstructure; Reliability; Solder joint; Thermal cycling
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Indexed keywords
RELIABILITY TESTING;
SOLDER REFLOW PROCESS;
AGING OF MATERIALS;
ELECTRIC CONNECTORS;
ELECTRONICS PACKAGING;
EUTECTICS;
FATIGUE OF MATERIALS;
FINITE ELEMENT METHOD;
GROWTH (MATERIALS);
INTERMETALLICS;
MATHEMATICAL MODELS;
MICROSTRUCTURE;
PRINTED CIRCUIT TESTING;
RELIABILITY;
SHEAR STRESS;
SURFACE MOUNT TECHNOLOGY;
THERMAL CYCLING;
TRANSDUCERS;
SOLDERED JOINTS;
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EID: 0038708592
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (3)
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References (6)
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