Three test problems for the comparison of lossy transmission line algorithms

IEEE Topical Meeting on Electrical Performance of Electronic Packaging

Volumn 2002-January, Issue , 2002, Pages 347-350

  Ruehli, A E ^a   Cangellaris, A C ^b   Huang, H M ^c  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^c IBM MICROELECTRONICS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ELECTRONICS PACKAGING;

ANALYSIS TECHNIQUES; LOSSY TRANSMISSION LINE; TEST PROBLEM; THREE MODELS;

TRANSIENT ANALYSIS;

EID: 0038752485     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EPEP.2002.1057947     Document Type: Conference Paper

References (0)