EBIT diagnostics using X-ray spectra of highly ionized Ne

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 205, Issue , 2003, Pages 244-249

  Matranga, Marco ^a   Barbera, Marco ^b   Maggio, Antonio ^b   Peres, Giovanni ^a,b   Serio, Salvatore ^a,b   Takács, Endre ^c,d   Silver, Eric ^e   Gillaspy, John ^f   Schnopper, Herbert ^e   Laming, Martin ^g   Beeman, Jeff ^h   Haller, Eugen ^h   Madden, Norman ^h  

^a UNIVERSITY OF PALERMO   (Italy)

^b INAF OSSERVATORIO ASTROFISICO DI TORINO   (Italy)

^c MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^d UNIVERSITY OF DEBRECEN   (Hungary)

^e SMITHSONIAN ASTROPHYSICAL OBSERVATORY   (United States)

^f NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^g NAVAL RESEARCH LABORATORY   (United States)

^h LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

EBIT; Excitation; Ionization of atoms; X ray spectra

Indexed keywords

ASTROPHYSICS; CARRIER CONCENTRATION; ELECTRON BEAMS; IONIZATION OF GASES; NEON; PLASMA DIAGNOSTICS; X RAY SPECTROSCOPY;

PLASMA EMISSION;

ELECTRON TRAPS;

EID: 0038670723     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(03)00943-1     Document Type: Conference Paper

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