Circuit yield of organic integrated electronics

Digest of Technical Papers - IEEE International Solid-State Circuits Conference

Volumn , Issue , 2003, Pages

  Cantatore, E ^a   Hart, C M ^a   Digioia, M ^b   Gelinck, G H ^a   Geuns, T C T ^a   Huitema, H E A ^a   Schrijnemakers, L R R ^a   Van Veenendaal, E ^a   De Leeuw, D M ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

^b State University   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CARRIER MOBILITY; ELECTRODES; INTEGRATED CIRCUIT LAYOUT; LEAKAGE CURRENTS; LOGIC GATES; PERFORMANCE; PLASTICS APPLICATIONS; SEMICONDUCTING ORGANIC COMPOUNDS; TEMPERATURE; THIN FILM TRANSISTORS; THRESHOLD VOLTAGE;

CIRCUIT YIELD; ORGANIC DIGITAL CIRCUITS; ORGANIC INTEGRATED ELECTRONICS; PLASTIC CIRCUITS; YIELD LOSS;

DIGITAL INTEGRATED CIRCUITS;

EID: 0038645218     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)

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