-
1
-
-
0002834460
-
Ceramic capacitor technology
-
Levinsod LM, editor. New York: Marcel Dekker
-
Kahn M, Burks DP, Burn I, Schulze WA. Ceramic capacitor technology. In: Levinsod LM, editor. Electronic ceramics. New York: Marcel Dekker, 1988. p. 191.
-
(1988)
Electronic Ceramics
, pp. 191
-
-
Kahn, M.1
Burks, D.P.2
Burn, I.3
Schulze, W.A.4
-
2
-
-
0023249516
-
Factors responsible for thermal shock behavior of chip capacitors
-
Boston, MA, USA
-
Rawal B, Ladew R, Garcia R. Factors responsible for thermal shock behavior of chip capacitors. In: Proceedings of the 37th Electronic Components Conferences, Boston, MA, USA. 1987. p. 145-156.
-
(1987)
Proceedings of the 37th Electronic Components Conferences
, pp. 145-156
-
-
Rawal, B.1
Ladew, R.2
Garcia, R.3
-
6
-
-
0032642685
-
Weibull analysis of soldered MLC under bending load stress
-
Franken K, Maier HR. Weibull analysis of soldered MLC under bending load stress. J Eur Ceram Soc 1999;19:1307-1310.
-
(1999)
J Eur Ceram Soc
, vol.19
, pp. 1307-1310
-
-
Franken, K.1
Maier, H.R.2
-
7
-
-
0012681817
-
Failure probability prediction of dielectric ceramics in multilayer capacitors
-
Cincinnate, OH ety, Cincinnate, OH
-
Wereszczak AA, Breder K, Ferber MK, Bridge RJ, Riester L, Kirkland TP. Failure probability prediction of dielectric ceramics in multilayer capacitors. In: Proceeding of the International Symposium on Multilayer Ceramic Division, Transactions of the AcerS, 100th Annual Meeting and Exhibition of the American Ceramic Society, Cincinnate, OH. 1998.
-
(1998)
Proceeding of the International Symposium on Multilayer Ceramic Division, Transactions of the AcerS, 100th Annual Meeting and Exhibition of the American Ceramic Society
-
-
Wereszczak, A.A.1
Breder, K.2
Ferber, M.K.3
Bridge, R.J.4
Riester, L.5
Kirkland, T.P.6
-
9
-
-
0027833657
-
Structural integrity of ceramic mulilayer capacitor materials and ceramic mulilayer capacitors
-
de With G. Structural integrity of ceramic mulilayer capacitor materials and ceramic mulilayer capacitors. J Eur Ceram Soc 1993;12:323-336.
-
(1993)
J Eur Ceram Soc
, vol.12
, pp. 323-336
-
-
de With, G.1
-
10
-
-
0000591672
-
Trends in advanced spark plasma sintering systems and technology
-
Tokita M. Trends in advanced spark plasma sintering systems and technology. J Soc Powder Technol Japan 1997;30(11):790-804.
-
(1997)
J Soc Powder Technol Japan
, vol.30
, Issue.11
, pp. 790-804
-
-
Tokita, M.1
-
11
-
-
0008291009
-
Plasma activated sintering a novel versatile
-
Upadhya K, editor. Minerals Metals & Materials Society
-
Groza JR, Rishud SH, Yamazaki Y. Plasma activated sintering a novel versatile. In: Upadhya K, editor. Plama synthesis and processing of materials. Minerals Metals & Materials Society, 1993. p. 85-93.
-
(1993)
Plama Synthesis and Processing of Materials
, pp. 85-93
-
-
Groza, J.R.1
Rishud, S.H.2
Yamazaki, Y.3
-
12
-
-
0029373973
-
The effect of erosional wear on strength and residual stress during shaping of ceramic multilayer capacitors
-
de With G, Sweegers N. The effect of erosional wear on strength and residual stress during shaping of ceramic multilayer capacitors. Wear 1995;188:142-149.
-
(1995)
Wear
, vol.188
, pp. 142-149
-
-
de With, G.1
Sweegers, N.2
-
13
-
-
0016521376
-
Indentation fracture: Principles and applications
-
Lawn BR, Wilshaw TR. Indentation fracture: principles and applications. J Mater Sci 1975;10(6):1049-1081.
-
(1975)
J Mater Sci
, vol.10
, Issue.6
, pp. 1049-1081
-
-
Lawn, B.R.1
Wilshaw, T.R.2
-
14
-
-
0018503878
-
Residual stress effects in sharp-contact cracking: I. Indentation fracture mechanics
-
Marshall DB, Lawn BR. Residual stress effects in sharpcontact cracking: I. Indentation fracture mechanics. J Mater Sci 1979;14(8):2001-2012.
-
(1979)
J Mater Sci
, vol.14
, Issue.8
, pp. 2001-2012
-
-
Marshall, D.B.1
Lawn, B.R.2
-
16
-
-
0343462248
-
Microstructure, stress and mechanical properties of are-evaporated Cr-C-N coatings
-
Almer J, Odén M, Håkansson G. Microstructure, stress and mechanical properties of are-evaporated Cr-C-N coatings. Thin Solid Films 2001;385:190-197.
-
(2001)
Thin Solid Films
, vol.385
, pp. 190-197
-
-
Almer, J.1
Odén, M.2
Håkansson, G.3
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