Crystallization of sputtered BaTiO3-based thin films: A differential scanning calorimetry study

Journal of Applied Physics

Volumn 88, Issue 10, 2000, Pages 6086-6088

  Chu, J P ^a   Wang, S F ^b   Lee, S J ^a   Chang, C W ^a  

^a NATIONAL TAIWAN OCEAN UNIVERSITY   (Taiwan)

^b NATIONAL TAIPEI UNIVERSITY OF TECHNOLOGY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038625740     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1321772     Document Type: Article

References (17)

1. S. K. Dey and R. Zuleeg, Ferroelectrics 108, 37 (1990).
2. R. Takayama and Y. Tomita, J. Appl. Phys. 64, 1666 (1989).
3. S. Krishnakumar, V. H. Oguz, C. Fan, C. Cozzolino, S. C. Esener, and S. H. Lee, IEEE Trans. Ultrason. Ferroelectr. Freq. Control 38, 585 (1991).
4. T. Horikawa, N. Mikami, T. Mikata, J. Tanimura, and M. Nunoshita, Jpn. J. Appl. Phys., Part 1 32, 329 (1993).
5. D. Ivanov, M. Caron, L. Ouellet, S. Blain, N. Henduck, and J. Currie, J. Appl. Phys. 77, 2666 (1995).
6. M. Okada, S. Takal, M. Amemiya, and K. Tominaga, Jpn. J. Appl. Phys., Part 1 28, 1030 (1989).
7. See, for example, Proceedings of the Thermal Analysis in Metallurgy, edited by R. D. Shull and A. Joshi (TMS, Warrendale, PA, 1992).
8. Q. X. Jia, L. H. Chang, and W. A. Anderson, J. Electron. Mater. 23, 551 (1994).
9. J. H. Kim and S. H. Shita, J. Mater. Sci. 30, 4645 (1995).
10. M. S. Tsai, S. C. Sun, and T. Y. Tseng, J. Appl. Phys. 82, 3482 (1997).
11. P. Pasierb, S. Komornicki, and M. Radecka, Thin Solid Films 324, 134 (1998).
12. S. F. Wang, J. P. Chu, and S. J. Lee (unpublished).
13. J. Z. Chen and S. K. Wu, Thin Solid Films 339, 194 (1999).
14. J. P. Chu, Y. W. Lai, T. N. Lin, and S. F. Wang, Mater. Sci. Eng., A 277, 11 (2000).
15. M. S. El-Eskandarany, K. Aoki, and K. Suzuki, Appl. Phys. Lett. 60, 1562 (1992).
16. M. S. El-Eskandarany, K. Aoki, and K. Suzuki, J. Appl. Phys. 72, 2665 (1992).
17. H. E. Kissinger, Anal. Chem. 29, 1702 (1957).