High-resolution transmission electron microscopy study of the microstructural development of a silicon carbonitride nanocomposite

Journal of the American Ceramic Society

Volumn 86, Issue 5, 2003, Pages 857-863

  Wan, Julin ^a   Gasch, Matthew J ^a   Lesher, Charles E ^b   Mukherjee, Amiya K ^a  

^a University of California   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GRAIN BOUNDARIES; HIGH RESOLUTION ELECTRON MICROSCOPY; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; POLYSILANES; PYROLYSIS; SILICON CARBIDE; SILICON NITRIDE; SINTERING; SUPERPLASTICITY; TRANSMISSION ELECTRON MICROSCOPY; YTTRIUM COMPOUNDS;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; NANOCRYSTALLINE CERAMICS; POLYSILAZANE; SILICON CARBONITRIDE;

CERAMIC MATERIALS;

EID: 0038620434     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.2003.tb03387.x     Document Type: Article

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