Silicon nitride based ceramic nanocomposites

Journal of the American Ceramic Society

Volumn 79, Issue 3, 1996, Pages 585-590

  Pan, Xiaoqing ^a,c   Mayer, Joachim ^a,c   Rühle, Manfred ^a,c   Niihara, Koichi ^b,c  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b OSAKA UNIVERSITY   (Japan)

^c AMERICAN CERAMIC SOCIETY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; CERAMIC MATERIALS; CRYSTAL GROWTH; ELECTRON ENERGY LOSS SPECTROSCOPY; GRAIN BOUNDARIES; INTERFACES (MATERIALS); LATTICE VIBRATIONS; MORPHOLOGY; NUCLEATION; SILICON CARBIDE; SILICON NITRIDE; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON ENERGY LOSS SPECTROSCOPIC IMAGING; GRAIN BOUNDARY FILM THICKNESS; GRAIN MORPHOLOGY; LATTICE IMAGING; LATTICE MISMATCH; PHASE BOUNDARIES; PHASE DISTRIBUTION;

NANOSTRUCTURED MATERIALS;

EID: 0030105872     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1996.tb07914.x     Document Type: Article

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