A comparison of the KOSSEL and the X-ray Rotation-Tilt Technique

Crystal Research and Technology

Volumn 38, Issue 6, 2003, Pages 440-449

  Bauch, J ^a   Ullrich, H J ^a   Bohling M ^a   Reiche, D ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Determination of lattice parameters; KOSSEL technique; Stress; Synchrotron radiation; X ray microdiffraction; X ray rotation tilt technique (XRT)

Indexed keywords

ELECTRON BEAMS; IMAGE ANALYSIS; STRESS ANALYSIS; SYNCHROTRON RADIATION; X RAY DIFFRACTION ANALYSIS;

MICRON REGIONS;

CRYSTALS;

EID: 0038604847     PISSN: 02321300     EISSN: None     Source Type: Journal    
DOI: 10.1002/crat.200310055     Document Type: Article

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