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Volumn , Issue , 1999, Pages 394-397

Robust digitization and digital non-uniformity correction in a single-chip CMOS camera

Author keywords

[No Author keywords available]

Indexed keywords

A/D CONVERSION; ANALOG CIRCUITRY; ANALOG HARDWARE; CORRELATED DOUBLE SAMPLING; DIGITAL CMOS CAMERAS; NONUNIFORMITY CORRECTION; SAMPLE-AND-HOLD FUNCTIONS; SIMPLE CIRCUITS;

EID: 0038595889     PISSN: 19308833     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (3)

References (6)
  • 1
    • 0031678269 scopus 로고    scopus 로고
    • A single-chip 306x244 pixel cmos ntsc video camera
    • San Francisco
    • S. Smith et al., "A Single-Chip 306x244 Pixel CMOS NTSC Video Camera", ISSCC Digest of Technical Papers, San Francisco, 1998, pp. 170-1
    • (1998) ISSCC Digest of Technical Papers , pp. 170-1
    • Smith, S.1
  • 2
    • 84893732665 scopus 로고    scopus 로고
    • Single-chip video camera with multiple integrated functions
    • San Francisco
    • U. Ramacher et al., "Single-Chip Video Camera With Multiple Integrated Functions", ISSCC Digest of Technical Papers, San Francisco, 1999, pp. 306-7.
    • (1999) ISSCC Digest of Technical Papers , pp. 306-7
    • Ramacher, U.1
  • 3
    • 0029269932 scopus 로고
    • A 10 b, 20 msample/s, 35 mw pipeline a/d converter
    • March
    • T. B. Cho, P. R. Gray, "A 10 b, 20 Msample/s, 35 mW Pipeline A/D Converter", IEEE Journal of Solid-State Circuits, Vol. 30, No. 3, March 1995, pp. 166-172
    • (1995) IEEE Journal of Solid-State Circuits , vol.30 , Issue.3 , pp. 166-172
    • Cho, T.B.1    Gray, P.R.2
  • 5
    • 0028392939 scopus 로고
    • CMOS active pixel image sensor
    • March
    • S. Mendis et al., "CMOS active pixel image sensor", IEEE Tr. on Electron Devices, Vol. 41, No. 3, March 1994, pp. 452-453
    • (1994) IEEE Tr. on Electron Devices , vol.41 , Issue.3 , pp. 452-453
    • Mendis, S.1
  • 6
    • 0030378204 scopus 로고    scopus 로고
    • Technology and device scaling considerations for cmos imagers
    • Dec
    • H.-S. Wong, "Technology and Device Scaling Considerations for CMOS Imagers", IEEE Tr. on Electron Devices, Vol. 43, No. 12, Dec 1996, pp. 2131-42
    • (1996) IEEE Tr. on Electron Devices , vol.43 , Issue.12 , pp. 2131-42
    • Wong, H.-S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.