Precise atomic mass measurements by deflection mass spectrometry

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 204, Issue , 2003, Pages 460-465

  Barber, R C ^a   Sharma, K S ^a  

^a UNIVERSITY OF MANITOBA   (Canada)

Author keywords

High resolution mass spectroscopy; Precise atomic masses

Indexed keywords

CHARGED PARTICLES; ELECTRIC FIELD EFFECTS; ISOTOPES; MAGNETIC FIELD EFFECTS;

ATOMIC MASS;

MASS SPECTROMETRY;

EID: 0038559515     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(02)02112-2     Document Type: Conference Paper

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