Magnetic domain of Fe73.5Cu1Nb3Si13.5B9 studied by electron holography coupled with thickness mapping method

Materials Transactions

Volumn 44, Issue 4, 2003, Pages 669-672

  Aoyama, Yoshitaka ^a   Park, Young Gil ^a   Shindo, Daisuke ^a   Yoshizawa, Yoshihito ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b HITACHI CABLE LTD   (Japan)

Author keywords

Electron energy loss spectroscopy; Electron holography; Inner potential; Magnetic flux; Thickness mapping

Indexed keywords

COMPUTER SIMULATION; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON HOLOGRAPHY; MAGNETIC FLUX; SOFT MAGNETIC MATERIALS; THICKNESS MEASUREMENT;

INNER POTENTIAL; IRON COPPER NIOBIUM SILICON NONABORIDE ALLOYS; MAGNETIC FLUX DENSITY; THICKNESS MAPPING;

IRON ALLOYS;

EID: 0038544154     PISSN: 13459678     EISSN: None     Source Type: Journal    
DOI: 10.2320/matertrans.44.669     Document Type: Article

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