Measurement of transmittance and permittivity of dielectric materials using dispersive Fourier transform spectroscopy

Microwave and Optical Technology Letters

Volumn 38, Issue 1, 2003, Pages 27-30

  Afsar, Mohammed N ^a   Wang, Yong ^a   Moonshiram, Anusha ^a  

^a TUFTS UNIVERSITY   (United States)

Author keywords

Complex permittivity; Dielectric materials; Fourier transform spectroscopy; Microwave measurement

Indexed keywords

ACRYLICS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; INTERFEROMETERS; MAXWELL EQUATIONS; MICROWAVE MEASUREMENT; PERMITTIVITY MEASUREMENT; POLYPROPYLENES; REFRACTIVE INDEX; SPECTROMETERS;

COMPLEX PERMITTIVITY; DISPERSIVE FOURIER TRANSFORM SPECTROSCOPY; LOSS TANGENT; PLEXIGLAS; TRANSMITTANCE MEASUREMENT;

DIELECTRIC MATERIALS;

EID: 0038521075     PISSN: 08952477     EISSN: None     Source Type: Journal    
DOI: 10.1002/mop.10961     Document Type: Article

References (5)

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