A novel b-band spectrometer for dielectric measurements

IEEE Transactions on Microwave Theory and Techniques

Volumn 48, Issue 12, 2000, Pages 2637-2643

  Afsar, Mohammed Nurul ^a   Tkachov, Igor I ^b   Kocharyan, Karen N ^c  

^a TUFTS UNIVERSITY   (United States)

^b AWARE INC   (United States)

^c Renaissance Electronics Corporation   (United States)

Author keywords

Dielectric constants; Dielectric materials; Gaussian beams; Millimeter waves; Permittivity; Quasi optics; W band, waveguide bridge

Indexed keywords

BROADBAND NETWORKS; DIELECTRIC MATERIALS; MILLIMETER WAVES; OPTICAL WAVEGUIDES; PERMITTIVITY;

GAUSSIAN BEAMS; QUASIOPTICS;

MICROWAVE SPECTROMETERS;

EID: 0034427304     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.899024     Document Type: Article

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