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Volumn 19, Issue 1, 2003, Pages 27-29

A study of AlN films prepared by arc ion plating

Author keywords

AIP; AlN; Bias; Preferential orientation

Indexed keywords

MECHANISMS; PLATING; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 0038506358     PISSN: 10050302     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (1)

References (18)
  • 5
    • 0001747102 scopus 로고
    • Ion beam and plasma modification of materials
    • Haper J.M.E., Miyake K., McNeil J.R. and Gorbatking S.M.(ed.), San-Francisco, U.S.A., MRS Proc.
    • R.F.Huang, L.S.Wen, J.Wu, H.Wang and R.J.Hong: Ion Beam and Plasma Modification of Materials, eds. J.M.E.Haper, K.Miyake, J.R.McNeil and S.M.Gorbatking, MRS 1991 Spring Meeting, San-Francisco, U.S.A., MRS Proc., 1991, 223, 289.
    • (1991) MRS 1991 Spring Meeting , vol.223 , pp. 289
    • Huang, R.F.1    Wen, L.S.2    Wu, J.3    Wang, H.4    Hong, R.J.5
  • 9
    • 0003495856 scopus 로고
    • Joint Committee on Powder Diffraction Standards, International Center for Powder Diffraction Data, Swartmore, PA
    • Powder Diffraction File, Joint Committee on Powder Diffraction Standards, International Center for Powder Diffraction Data, Swartmore, PA, 1984, Card 25-1133.
    • (1984) Powder Diffraction File (Card 25-1133) , pp. 25-1133


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.