Photometric methods for determining the optical constants and the thicknesses of thin absorbing films: Criteria for precise and unambiguous determination of n, k, and d in a wide spectral range

Applied Optics

Volumn 40, Issue 16, 2001, Pages 2682-2686

  Babeva, Tzwetanka ^a   Kitova, Snejana ^a   Konstantinov, Ivan ^a  

^a CENTRAL LABORATORY OF PHOTOPROCESSES   (Bulgaria)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR ANALYSIS; LIGHT REFLECTION; PHOTOMETRY; REFRACTIVE INDEX; SUBSTRATES;

OPTICAL CONSTANTS;

THIN FILMS;

EID: 0038502194     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.40.002682     Document Type: Article

References (13)

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