Photometric methods for determining the optical constants and the thicknesses of thin absorbing films: Selection of a combination of photometric quantities on the basis of error analysis

Applied Optics

Volumn 40, Issue 16, 2001, Pages 2675-2681

  Babeva, Tzwetanka ^a   Kitova, Snejana ^a   Konstantinov, Ivan ^a  

^a CENTRAL LABORATORY OF PHOTOPROCESSES   (Bulgaria)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR ANALYSIS; LIGHT REFLECTION; LIGHT TRANSMISSION; REFRACTIVE INDEX; SPECTROPHOTOMETRY; SUBSTRATES;

PHOTOMETRIC METHODS;

THIN FILMS;

EID: 0038261939     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.40.002675     Document Type: Article

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