Triple-junction colour sensor fully compatible with CMOS technology: Results of a test chip

IEEE International Conference on Microelectronic Test Structures

Volumn , Issue , 2002, Pages 217-222

  Dalla Betta, G F ^a   Zorzi, N ^a   Bellutti, P ^a   Boscardin, M ^a   Soncini, G ^a,b  

^a ITC IRST   (Italy)

^b UNIVERSITY OF TRENTO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROOPTICAL EFFECTS; IMAGE SENSORS; INTEGRATED CIRCUIT TESTING; MASKS;

CMOS TECHNOLOGY; ELECTROOPTICAL CHARACTERISATION; TEST CHIP; TRIPLE JUNCTION COLOUR SENSOR;

CMOS INTEGRATED CIRCUITS;

EID: 0038495566     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)

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