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Volumn 208, Issue 1-4, 2003, Pages 137-142
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Observation of heavy-ion tracks in polyimide by means of high-resolution scanning electron microscopy
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Author keywords
Etched tracks; Etching model; Latent tracks; Polyimide; Track structure
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Indexed keywords
ETCHING;
POLYIMIDES;
SCANNING ELECTRON MICROSCOPY;
URANIUM;
HEAVY-ION TRACKS;
HEAVY IONS;
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EID: 0038487356
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(03)00618-9 Document Type: Conference Paper |
Times cited : (8)
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References (11)
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