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Volumn 208, Issue 1-4, 2003, Pages 137-142

Observation of heavy-ion tracks in polyimide by means of high-resolution scanning electron microscopy

Author keywords

Etched tracks; Etching model; Latent tracks; Polyimide; Track structure

Indexed keywords

ETCHING; POLYIMIDES; SCANNING ELECTRON MICROSCOPY; URANIUM;

EID: 0038487356     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(03)00618-9     Document Type: Conference Paper
Times cited : (8)

References (11)
  • 10
    • 0000467928 scopus 로고
    • J.C. Bailar, H.J. Emeleus, R. Nyholm, Trotman-DickensonA.F. Oxford: Pergamon
    • Downs A.J., Adams C.J. Bailar J.C., Emeleus H.J., Nyholm R., Trotman-Dickenson A.F. Comprehensive Inorganic Chemistry. Vol. 2:1973;1107 Pergamon, Oxford.
    • (1973) Comprehensive Inorganic Chemistry , vol.2 , pp. 1107
    • Downs, A.J.1    Adams, C.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.