Atomic force microscopy characterization of ultrathin polystyrene films formed by admicellar polymerization on silica disks

Journal of Applied Polymer Science

Volumn 89, Issue 1, 2003, Pages 36-46

  See, Chun Hwa ^a   O'Haver, John ^a  

^a The University of Mississippi   (United States)

Author keywords

Composites; Interfaces; Nanoheterogeneity; Poly styrene; Thin films

Indexed keywords

ADSORPTION; ATOMIC FORCE MICROSCOPY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MORPHOLOGY; POLYMERIZATION; PRECIPITATION (CHEMICAL); SCANNING ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SILICA; SURFACE ACTIVE AGENTS; SURFACE ROUGHNESS; ULTRATHIN FILMS;

ADMICELLAR POLYMERIZATION;

POLYSTYRENES;

FILM; MICROSCOPY; POLYSTYRENE;

EID: 0038485733     PISSN: 00218995     EISSN: None     Source Type: Journal    
DOI: 10.1002/app.12092     Document Type: Article

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