Fabrication and characterization of Mn-doped zinc silicate films on silicon wafer

Journal of Crystal Growth

Volumn 255, Issue 3-4, 2003, Pages 353-356

  Ji, Zhenguo ^a   Kun, Liu ^a   Yongliang, Song ^a   Zhizhen, Ye ^a  

^a ZHEJIANG UNIVERSITY   (China)

Author keywords

A1. Photoluminescence; A1. Si based optoelectronics; B1. Zinc silicate

Indexed keywords

DOPING (ADDITIVES); GRAIN SIZE AND SHAPE; LIGHT ABSORPTION; MANGANESE; OPTOELECTRONIC DEVICES; OXIDATION; PHOTOLUMINESCENCE; SILICON WAFERS; SOL-GELS; X RAY DIFFRACTION ANALYSIS; ZINC COMPOUNDS;

SCANNING FORCE MICROSCOPES;

SEMICONDUCTING FILMS;

EID: 0038481252     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(03)01291-0     Document Type: Article

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