Dielectric response and impedance spectroscopy of 0.7Pb(Mg1/3Nb2/3)O3-0.3PbTiO3 thin films

Materials Science and Engineering: B

Volumn 98, Issue 3, 2003, Pages 204-212

  Laha, Apurba ^a   Krupanidhi, S B ^a  

^a INDIAN INSTITUTE OF SCIENCE   (India)

Author keywords

Dielectric response; Diffused phase transition; Impedance spectroscopy; Relaxor ferroelectrics

Indexed keywords

DIELECTRIC RELAXATION; GRAIN BOUNDARIES; LEAD COMPOUNDS; PERMITTIVITY; PHASE TRANSITIONS; SPECTROSCOPY; THIN FILMS;

RELAXOR FERROELECTRICS;

FERROELECTRIC MATERIALS;

EID: 0038476195     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(03)00033-3     Document Type: Article

References (39)

1. Cross L.E. Ferroelectrics. 76:1987;241.
2. Smolensky G.A., Agranovskaya A.I. Sov. Phys. Solid State. 1:1959;1429.
3. Westphal, Kleeman W., Glinchuk M.D. Phys. Rev. Lett. 68:1992;947.
4. Huser D., Wenger L., Vanduyneveld A., Mydosh J. Phys. Rev. B. 27:1983;5.
5. Kighelman Z., Damjanovic D., Setter N. J. Appl. Phys. 90:2001;4682.
6. Maria J.P., Hackenberger W., Trolier-Mckinstry S. J. Appl. Phys. 84:1998;5147.
7. Nagarajan V., Alpay S.P., Ganpule C.S., Nagaraj B.K., Aggarwal S., Williams E.D., Roytburd A.L., Ramesh R. Appl. Phys. Lett. 77:2000;438.
8. Tyunina M., Levoska J. Phys. Rev. B. 63:2001;224102.
9. Pertsev N.A., Zembilgotov A.G., Hoffman S., Waser R., Tagantsev A.K. J. Appl. Phys. 85:1998;1988.
10. Zhou C., Newns D.M. J. Appl. Phys. 82:1997;3081.
11. Tagantsev A.K., Landivar M., Colla E., Setter N. J. Appl. Phys. 78:1995;2623.
12. Werfel P., Batra I.P. Phys. Rev. B. 8:1973;5126.
13. Streiffer S.K., Basceri C., Parker C.B., Lash S.E., Kingon A.I. J. Appl. Phys. 86:1999;4565.
14. Sayer M., Monsingh A., Arora A.K., Lo L. Intergr. Ferroelectrics. 1:1992;129.
15. Swartz S.L., Shrout T.R. Mater. Res. Bull. 72:1989;1335.
16. Saha S., Krupanidhi S.B. Mater. Sci. Eng. B. 57:1999;135.
17. A. Laha, S. Saha, S.B. Krupanidhi, in: Thin Solid Films, 424 (2002) 274.
18. Colla E.V., Koroleva E.U., Okuneva N.M., Vakhrushev S.B. J. Phys.: Condens. Matter. 4:1992;3671.
19. Vugmeister B.E., Rabitz H. Phys. Rev. B. 57:1998;7581.
20. Bonneau P., Garnier O., Calvarin G., Husson E., Gavarri J.R., Hewat A.W., Morrel A. J. Solid State Chem. 91:1991;350.
21. Vugmeister B.E., Rabitz H. Phys. Rev. B. 57:1998;7581.
22. Lyons K.B., Fleury P.A., Negran T.J., Carter H.L. Phys. Rev. B. 36:1987;2465.
23. Levstik A., Kutnjak Z., Filipic C., Pirc R. Phys. Rev. B. 57:1998;11204.
24. Dkhil B., Kiat J.M. J. Appl. Phys. 90:2001;4676.
25. Viehland D., Li J.F., Jang S.J., Cross L.E., Wuttig M. Phys. Rev. B. 46:1992;8013.
26. Chen I.W., Li P., Wang Y. J. Phys. Chem. Solids. 57:1996;1525.
27. Tholence J. J. Appl. Phys. 50:1979;7369.
28. Shtrikman S., Wohlfarth E. Phys. Lett. 85A:1981;467.
29. Levy L.P., Ogielski A.T. Phys. Rev. Lett. 57:1986;3288.
30. Viehland D., Jang S., Cross L.E., Wuttig M. J. Appl. Phys. 68:1991;8316.
31. Viehland D., Jang S., Cross L.E., Wuttig M. Phys. Rev. B. 43:1991;8316.
32. Tagantsev A.K. Phys. Rev. Lett. 72:1994;1100.
33. Sinclair D.C., West A.R. J. Mater. Sci. 29:1994;6061.
34. Macdonald J.R. Impedance Spectroscopy. 1987;Wiley.
35. Saha S., Krupanidhi S.B. J. Appl. Phys. 87:2000;849.
36. Sinclair D.C., West A.R. J. Appl. Phys. 66:1989;3850.
37. Sinclair D.C., West A.R. J. Electroanal. Chem. 74:1976;125.
38. Courtens E. Phys. Rev. B. 33:1986;2975.
39. Zhou C., Newns D.M. J. Appl. Phys. 82:1997;3081.