Soft X-ray absorption spectroscopy study of the effects of Si, Ce, and Mo ion implantation on the passive layer of AISI 304 stainless steel

Corrosion Science

Volumn 45, Issue 9, 2003, Pages 2043-2053

  Lopez M F ^a   Gutierrez A ^b   Perez F J ^c   Hierro, M P ^c   Pedraza, F ^c  

^a INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

^b UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^c UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

Author keywords

A. Stainless steel; B. Ion implantation; C. Passive films

Indexed keywords

CERIUM; CHEMICAL MODIFICATION; ION IMPLANTATION; SILICON; X RAY SPECTROSCOPY;

X-RAY ABSORPTION SPECTROSCOPY;

STAINLESS STEEL;

ABSORPTION; MONITORING; SPECTROSCOPY; STAINLESS STEEL; X-RAY;

EID: 0038454665     PISSN: 0010938X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0010-938X(03)00029-5     Document Type: Article

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