Effect of F2 laser power on defect formation in high-purity SiO2 glass

Journal of Non-Crystalline Solids

Volumn 322, Issue 1-3, 2003, Pages 73-77

  Kajihara, Koichi ^a   Ikuta, Yoshiaki ^a   Hirano, Masahiro ^a   Hosono, Hideo ^a,b  

^a JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; DEFECTS; LASER BEAM EFFECTS; PHOTONS; QUANTUM THEORY;

LASER POWER;

FUSED SILICA;

EID: 0038449205     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(03)00177-7     Document Type: Conference Paper

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