Origin of the hook effect in extrinsic photoconductors

Applied Optics

Volumn 40, Issue 31, 2001, Pages 5748-5754

  Haegel, Nancy M ^a   Beeman, Jeffrey W ^c   Zinter, Joseph ^a   White, A Michael ^b  

^a FAIRFIELD UNIVERSITY   (United States)

^b White Numeric Consulting Ltd   (United Kingdom)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DETECTORS; FINITE DIFFERENCE METHOD; PHOTONS;

HOOK EFFECT;

PHOTOCONDUCTING MATERIALS;

EID: 0038448323     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.40.005748     Document Type: Article

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