Precipitation of Heusler phase (Ni2TiAl) from B2-TiNi in Ni-Ti-Al and Ni-Ti-Al-X (X = Hf, Zr) alloys

Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science

Volumn 34 A, Issue 6, 2003, Pages 1221-1235

  Jung, J ^a   Ghosh, G ^a   Isheim, D ^a   Olson, G B ^a  

^a Northwestern University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; ALLOYING ELEMENTS; CRYSTAL GROWTH; CRYSTAL MICROSTRUCTURE; PHASE EQUILIBRIA; PHASE TRANSITIONS; PRECIPITATION (CHEMICAL); SHAPE MEMORY EFFECT; STRAIN RATE; TEMPERATURE; TRANSMISSION ELECTRON MICROSCOPY;

CONTROLLED MISFIT STRAIN; HEUSLER PHASE; LANGER-SCHWARTZ THEORY; NICKEL TITANIUM ALUMINUM ALLOYS; THREE DIMENSIONAL ATOM PROBE MICROSCOPY;

NICKEL ALLOYS;

EID: 0038447234     PISSN: 10735623     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11661-003-0233-7     Document Type: Article

References (57)

1. H. Kahn, M.A. Huff, and A.H. Heuer: J. Micromech. Microeng., 1998, vol. 8, pp. 213-21.
2. T. Matsunaga, S. Kajiwara, K. Ogawa, T. Kikuchi, and S. Miyazaki: Mater. Sci. Eng. A, 1999, vol. 273-275, pp. 745-48.
3. H.D. Gu, L. You, K.M. Leung, C.Y. Chung, K.S. Chan, and J.K.L. Lai: Appl. Surf. Sci., 1998, vol. 129, pp. 579-83.
4. S. Miyazaki and A. Ishida: Mater. Sci. Eng. A, 1999, vols. 273-275, pp. 106-33.
5. R.H. Wolf and A.H. Heuer: J. Microelectromech. S., 1995, vol. 4, pp. 206-12.
6. K.R.C. Gisser, J.D. Busch, A.D. Johnson, and A.B. Ellis: Appl. Phys. Lett., 1992, vol. 61, pp. 1632-34.
7. S. Kajiwara, T. Kikuchi, K. Ogawa, T. Matsunaga, and S. Miyazaki: Phil. Mag. Lett., 1996, vol. 74, pp. 137-44.
8. S. Kajiwara; J. Phys. IV, 2001, vol. 11, pp. 395-405.
9. A. Ishida, K. Ogawa, M. Sato, and S. Miyazaki: Metall. Mater. Trans. A, 1997, vol. 28A, pp. 1985-91.
10. K. Ohishi, Z. Horita, and M. Nemoto: Mater. T. JIM, 1997, vol. 38, pp. 99-106.
11. Y. Koizumi, Y. Ro, S. Nakazawa, and H. Harada: Mater. Sci. Eng. A, 1997, vol. 223, pp. 36-41.
12. P. Villars and L.D. Calvert: Pearson's Handbook of Crystallographic Data for Intermetallic Phases, ASTM International, Newbury, OH, 1991, pp. 961 and 4714.
13. W.C. Johnson and P.W. Voorhees: Solid State Phenom., 1992, vol. 23, pp. 87-104.
14. D.R. Angst, P.E. Thoma, and M.Y. Kao: J. Phys. IV, 1995, C8, pp. 747-752.
15. J.H. Mulder, J.H. Maas, and J. Beyer: Proceedings of the International Conference on Martensitic Transformations, 1992, pp. 869-874.
16. R. Kainuma, I. Ohnuma, and K. Ishida: J. Chim. Phys. PCB, 1997, vol. 94, pp. 978-85.
17. http://rsb.info.nih.gov/nih-image/
18. J.I. Goldstein, D.B. Williams, and G. Cliff: in Principles of Analytical Electron Microscopy, D.C. Joy, A.D. Romig Jr., and J.I. Goldstein, eds., Plenum Press, New York, NY, 1986, pp. 155-217.
19. DTSA: Desk Top Spectrum Analyzer and X-ray Database, Standard Reference Data Program, National Institute of Standards and Technology, Gaithersburg, MD, 1997.
20. G. Cliff and G.W. Lorimer: J. Microsc., 1975, vol. 103, pp. 203-07.
21. J.I. Goldstein, D.E. Newbury, P. Echlin, D.C. Joy, C. Fiori, and E. Lifshin: Scanning Electron Microscopy and X-ray Microanalysis. Plenum Press, New York, NY, 1984.
22. Z. Horita, T. Sano, and M. Nemoto: J. Microsc., 1986, vol. 143, pp. 215-31.
23. D.B. Williams: Practical Analytical Electron Microscopy in Materials Science, Philips Electronic Instruments, Inc., Electron Optics Publishing Group, Mahwah, NJ, 1987.
24. P. Warren, Y. Murakami, Y. Koizumi, and H. Harada: Mater. Sci. Eng. A, 1997, vol. 223, pp. 17-20.
25. http://servermac.geologie.uni-frankfurt.de/MacDiff.html
26. International Tables for crystallography, International Union of Crystallography, Kluwer Academic Publishers, Boston, MA, 1993, pp. 65-68.
27. P.W. Voorhees and R.J. Schaefer: Acta Metall., 1987, vol. 35, pp. 327-39.
28. O. Hellman, J. Vandenbroucke, J.B. du Rivage, and D.N. Seidman: Mater. Sci. Eng. A, 2002, vol. 327, pp. 29-33.
29. M. Nishida, C.M. Wayman, and T. Honma: Metall. Trans. A, 1986, vol. 17A, pp. 1505-15.
30. J. Khalil-Allafia, A. Dlouhy, and G. Eggeler: Acta Mater., 2002, vol. 50, pp. 4255-74.
31. T. Hara, T. Ohba, K. Otsuka, and M. Nishida: Mater. Trans. JIM, 1997, vol. 38, pp. 277-84.
32. T. Mura: In Micromechanics of Defects in Solids, Kluwer Academic Publishers, Hingham, MA, 1987.
33. H. Matsumoto and H. Ishiguro: J. Less-Common Met., 1989, vol. 153, pp. 57-63.
34. H.P. Stüwe and Y. Shimomura: Z. Metallkd., 1960, vol. 51, pp. 180-81.
35. T.V. Philip and P.A. Beck: Trans. AIME, 1957, vol. 209, pp. 1269-71.
36. G.R. Purdy and J.G. Parr: Trans. AIME, 1961, vol. 221, pp. 636-39.
37. P.H. Kitabjian and W.D. Nix: Acta Mater., 1998, vol. 46, pp.701-10.
38. N. Schmitz-Pranghe and P. Dünner: Z. Metallkd., 1968, vol. 59, pp. 377-82.
39. P.A. Romans, O.G. Paasche, and H. Kato: J. Less-Common Met., 1965, vol. 8, pp. 213-15.
40. V.N. German, A.A. Bakanova, L.A. Tarasova, and Y.N. Sumulov: Soviet Physics-Solid State, 1970, vol. 12, pp. 490-91.
41. A.A. Klopotov, T.L. Chekalkin, and V.É. Gyunter: Tech. Phys., 2001, vol. 46, pp. 770-72.
42. W.J. Boettinger, L.A. Bendersky, J. Cline, J.A. West, M.J., and Aziz: Mater. Sci. Eng. A, 1991, vol. 133, pp. 592-95.
43. P.W. Voorhees, G.B. McFadden, and W.C. Johnson: Acta Mater., 1992, vol. 40, pp. 2979-92.
44. O. Mercier, K.N. Melton, G. Gremaud, and J. Hägi: J. Appl. Phys., 1980, vol. 51, pp. 1833-34.
45. C.H. Su and P.W. Voorhees: Acta Mater., 1996, vol. 44, pp. 2001-16.
46. H. Mehrer, M. Eggersmann, A. Gude, M. Salamon, and B. Sepiol: Mater. Sci. Eng. A, 1997, vol. 240, pp. 889-98.
47. G. Erdelyi, Z. Erdelyi, D.L. Beke, J. Bernardini, and C. Lexcellent: Phys. Rev. B, 2000, vol. 62, pp. 11284-87.
48. J.S. Langer and A.J. Schwartz: Phys. Rev. A, 1980, vol. 21, pp. 948-58.
49. M. Enomoto and T. Kumeta: Intermetallics, 1997, vol. 5, pp. 103-09.
50. R.D. Field, R. Darolia, and D.F. Lahrman: Scripta Metall., 1989, vol. 23, pp. 1469-74.
51. W.J. Boettinger, L.A. Bendersky, F.S. Biancaniello, and J.W. Cahn: Mater. Sci. Eng., 1988, vol. 98, pp. 273-76.
52. I. Ansara: Laboratoìre de Thermodynamique et de Physìco-Chìmìe Métallurgiques, CNRS/INPG/UJF, ENSEEG, B.P. 75, 38402 Saìnt-Martìn d'Hères, France, personal communication, 1995.
53. O.C. Hellman, J.A. Vandenbroucke, J. Rüsing, D. Isheim, and D.N. Seidman: Microsc. Microanal., 2000, vol. 6, pp. 437-444.
54. H. Hosoda, A. Kamio, T. Suzuki, and Y. Mishima: J. Jpn Inst. Met., 1996, vol. 60, pp. 793-801.
55. N.I. Medvedeva, Y.N. Gornostyrev, D.L. Novikov, O.N. Mryasov, and A.J. Freeman: Acta. Mater., 1998, vol. 46, pp. 3433-42.
56. Y.Y. Ye, C.T. Chan, and K.M. Ho: Phys. Rev. B, 1997, vol. 56, pp. 3678-89.
57. D.A. Muller, D.J. Singh, and J. Silcox: Phys. Rev. B, 1998, vol. 57, pp. 8181-202.