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Volumn 14, Issue 8, 2003, Pages 471-476

Defect profile and electrical properties of Nb2O5-doped BaTiO3 materials

Author keywords

[No Author keywords available]

Indexed keywords

ADDITION REACTIONS; COMPOSITION EFFECTS; CRYSTAL DEFECTS; CRYSTAL LATTICES; CRYSTAL MICROSTRUCTURE; DOPING (ADDITIVES); ELECTRIC PROPERTIES; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; NIOBIUM COMPOUNDS; SINTERING;

EID: 0038445921     PISSN: 09574522     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1023912615421     Document Type: Article
Times cited : (7)

References (30)
  • 1
    • 0003957444 scopus 로고
    • Semiconductor ceramics-grain boundary effects
    • (Ellis Horwood, England)
    • L. Hozer, in "Semiconductor Ceramics-Grain boundary effects" (Ellis Horwood, England, 1994) p. 109.
    • (1994) , pp. 109
    • Hozer, L.1
  • 2
    • 0038305783 scopus 로고    scopus 로고
    • edited by K. M. Nair and A. S. Bhalla (The American Ceramic Society, Ohio, USA)
    • M. N. Rahaman, in "Dielectric Ceramic Materials, Ceramics Transactions" Vol. 100, edited by K. M. Nair and A. S. Bhalla (The American Ceramic Society, Ohio, USA, 1999) p. 23.
    • (1999) Dielectric Ceramic Materials, Ceramics Transactions , vol.100 , pp. 23
    • Rahaman, M.N.1
  • 26
    • 0019687855 scopus 로고
    • edited by L.M. Levinson (The American Ceramic Society, Inc., Ohio, USA)
    • G. H. Jonker, in "Advances in Ceramics" Vol. 1, edited by L.M. Levinson (The American Ceramic Society, Inc., Ohio, USA, 1981) p. 155.
    • (1981) Advances in Ceramics , vol.1 , pp. 155
    • Jonker, G.H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.