An XPS and atomic force microscopy study of the micro-wetting behavior of water on pure chromium

Materials Transactions

Volumn 44, Issue 3, 2003, Pages 389-395

  Wang, Rongguang ^a   Kido, Mitsuo ^a   Morihiro, Naoki ^a  

^a HIROSHIMA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Distilled water; Macro wetting; Micro wetting; Organic contaminants; Wetting contact angle

Indexed keywords

ADSORPTION; ATOMIC FORCE MICROSCOPY; CHROMIUM; CONDENSATION; CONTACT ANGLE; EVAPORATION; IMPURITIES; MORPHOLOGY; OXIDATION; PHASE COMPOSITION; X RAY PHOTOELECTRON SPECTROSCOPY;

DISTILLED WATER; HYDROXIDE LAYER; MACRO WETTABILITY; MICRO WETTING; THIN LIQUID LAYER;

WETTING;

EID: 0038441649     PISSN: 13459678     EISSN: None     Source Type: Journal    
DOI: 10.2320/matertrans.44.389     Document Type: Article

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