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Volumn 38, Issue 4 B, 1999, Pages 2373-2376
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Transmission electron microscopic studies of TiSi2 microstructures and the C49-C54 phase transformation in narrow lines
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Author keywords
C54 nucleation; Narrow lines; Phase transformation; Pre amorphization implantation treatment; TEM; TiSi2; Two dimensional growth
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Indexed keywords
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EID: 0038420316
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.38.2373 Document Type: Article |
Times cited : (3)
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References (16)
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