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Volumn 38, Issue 4 B, 1999, Pages 2373-2376

Transmission electron microscopic studies of TiSi2 microstructures and the C49-C54 phase transformation in narrow lines

Author keywords

C54 nucleation; Narrow lines; Phase transformation; Pre amorphization implantation treatment; TEM; TiSi2; Two dimensional growth

Indexed keywords


EID: 0038420316     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.38.2373     Document Type: Article
Times cited : (3)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.