Diode characterization of Rockwell LWIR HgCdTe detector arrays

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4850, Issue 2, 2002, Pages 927-934

  Bacon, Candice M ^a   Pipher, Judith L ^a   Forrest, William J ^a   McMurtry, Craig W ^a   Garnett, James D ^b  

^a UNIVERSITY OF ROCHESTER   (United States)

^b ROCKWELL SCIENTIFIC COMPANY   (United States)

Author keywords

Dark Current; Diode Characterization; HgCdTe; Infrared Space Missions; Long Wave InfraRed (LWIR) Detector

Indexed keywords

ASTRONOMY; MERCURY COMPOUNDS; OPTICAL TELESCOPES; QUANTUM EFFICIENCY;

SPACE MISSIONS;

INFRARED DETECTORS;

EID: 0038401133     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.461922     Document Type: Conference Paper

References (4)

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