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Volumn 3354, Issue , 1998, Pages 77-86

Prospects for large format IR astronomy FPAs using MBE-grown HgCdTe detectors with cutoff wavelength > 4 μm

Author keywords

FPA; HgCdTe; Infrared; IR astronomy; MBE

Indexed keywords

FPA; HGCDTE; INFRARED; IR ASTRONOMY; MBE;

EID: 0010943632     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.317331     Document Type: Conference Paper
Times cited : (14)

References (15)
  • 4
    • 85075913343 scopus 로고
    • Low-Noise Performance and Dark Current Measurements on the 256x256 NICMOS3 FPA
    • D.E. Cooper, D.Q. Bui, R.B. Bailey, L.J. Kozlowski, and K. Vural, "Low-Noise Performance and Dark Current Measurements on the 256x256 NICMOS3 FPA," SPIE 1946, pp. 170-178,1994
    • (1994) SPIE , vol.1946 , pp. 170-178
    • Cooper, D.E.1    Bui, D.Q.2    Bailey, R.B.3    Kozlowski, L.J.4    Vural, K.5
  • 5
    • 85126506957 scopus 로고    scopus 로고
    • L.J. Kozlowski, K. Vural, S. A Cabelli, C. A. Chen, D.E. Cooper, D. M. Stephenson, and W.E. Kleinhans, 2.5 μm PACE-1 HgCdTe 1024x1024 FPA for Infrared Astronomy, SPIE 2268 (1994).
    • L.J. Kozlowski, K. Vural, S. A Cabelli, C. A. Chen, D.E. Cooper, D. M. Stephenson, and W.E. Kleinhans, "2.5 μm PACE-1 HgCdTe 1024x1024 FPA for Infrared Astronomy," SPIE 2268 (1994).
  • 10
    • 0021482804 scopus 로고
    • Hot-electron-induced photon and photocarrier generation in silicon MOSFET's
    • Sept
    • S. Tam and C. Hu, "Hot-electron-induced photon and photocarrier generation in silicon MOSFET's," IEEE Trans. Electron Devices, ED.31, Sept. 1984, 1264-1273.
    • (1984) IEEE Trans. Electron Devices, ED , vol.31 , pp. 1264-1273
    • Tam, S.1    Hu, C.2
  • 11
    • 0031186149 scopus 로고    scopus 로고
    • Dynamic Internal Testing of CMOS Circuits using Hot Luminescence
    • J.A. Kash and J.C. Tsang, "Dynamic Internal Testing of CMOS Circuits using Hot Luminescence," IEEE EDL, 18 (7), (1997) 330-332.
    • (1997) IEEE EDL , vol.18 , Issue.7 , pp. 330-332
    • Kash, J.A.1    Tsang, J.C.2
  • 12
    • 0020135129 scopus 로고
    • Electronic Properties of HgCdTe
    • M.A. Kinch, "Electronic Properties of HgCdTe," J. Vac. Sci. Tech. 21, 215-219 (1982).
    • (1982) J. Vac. Sci. Tech , vol.21 , pp. 215-219
    • Kinch, M.A.1
  • 13
    • 60949084479 scopus 로고    scopus 로고
    • U.S. Patent 5,585,624, Apparatus and Method for Mounting and Stabilizing a Hybrid Focal Plane Array, 1996
    • U.S. Patent 5,585,624, "Apparatus and Method for Mounting and Stabilizing a Hybrid Focal Plane Array." (1996).
  • 15
    • 0029749015 scopus 로고    scopus 로고
    • Low noise capacitive transimpedance amplifier performance vs. alternative IR detector interface schemes in submicron CMOS
    • L.J. Kozlowski, "Low noise capacitive transimpedance amplifier performance vs. alternative IR detector interface schemes in submicron CMOS," SPIE, Vol 2745 (1996).
    • (1996) SPIE , vol.2745
    • Kozlowski, L.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.