Differential partial ionization cross sections for 10-24 keV electrons colliding with helium and neon atoms

Journal of Physics B: Atomic, Molecular and Optical Physics

Volumn 36, Issue 8, 2003, Pages 1545-1558

  Singh, R K ^a   Shanker, R ^a  

^a BANARAS HINDU UNIVERSITY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; ELECTRON BEAMS; ELECTRON ENERGY LEVELS; ELECTRON MULTIPLIERS; ELECTRONS; HELIUM; MASS SPECTROMETERS; NEON;

AUGER PROCESS; CHARGE STATE FRACTIONS; DIFFERENTIAL PARTIAL IONIZATION CROSS SECTIONS; EJECTED ELECTRON-ION COINCIDENCE TECHNIQUE; TIME-OF-FLIGHT MASS SPECTROMETER;

ATOMIC PHYSICS;

EID: 0038392888     PISSN: 09534075     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-4075/36/8/309     Document Type: Article

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