Design and fabrication of a time-of-flight spectrometer for studies of multiple ionization of gases by charged particle impact

Pramana - Journal of Physics

Volumn 58, Issue 4, 2002, Pages 623-638

  Singh, R K ^a   Mohanta, R K ^a   Singh, M J ^a,b   Hippler, R ^a,c   Goel, S K ^a,d   Shanker, R ^a  

^a BANARAS HINDU UNIVERSITY   (India)

^b INSTITUTE FOR PLASMA RESEARCH   (India)

^c UNIVERSITY OF GREIFSWALD   (Germany)

^d DST   (India)

Author keywords

Multiple ionization; Recoil ions; Time of flight (TOF) spectrometer

Indexed keywords

ELECTRONIC DENSITY OF STATES; ELECTRONS; MATHEMATICAL MODELS; OPTIMIZATION; SPECTROMETERS;

CHARGE STATE DISTRIBUTIONS; MULTIPLE IONIZATION; TIME OF FLIGHT SPECTROMETER;

IONIZATION OF GASES;

EID: 0036538265     PISSN: 03044289     EISSN: None     Source Type: Journal    
DOI: 10.1007/s12043-002-0020-9     Document Type: Article

References (4)