High-resolution TEM analysis of defect structures in mechanically milled, nanocrystalline Fe

ISIJ International

Volumn 43, Issue 5, 2003, Pages 755-760

  Murayama, M ^a   Howe, J M ^b   Hidaka, H ^c   Takaki, S ^c  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b University of Virginia   (United States)

^c KYUSHU UNIVERSITY   (Japan)

Author keywords

High resolution transmission electron microscopy; Mechanically milled iron; Nanostructure; Ultrafine grained material

Indexed keywords

DIFFRACTION; GRAIN BOUNDARIES; IRON; MILLING (MACHINING); NANOSTRUCTURED MATERIALS; PLASTIC DEFORMATION; POWDERS; TRANSMISSION ELECTRON MICROSCOPY;

ULTRAFINE-GRAINED MATERIALS;

CRYSTAL DEFECTS;

EID: 0038379837     PISSN: 09151559     EISSN: None     Source Type: Journal    
DOI: 10.2355/isijinternational.43.755     Document Type: Article

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