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Volumn 15, Issue 2, 2003, Pages 113-150

Assembly root cause analysis: A way to reduce dimensional variation in assembled products

Author keywords

Design for diagnosis; Diagnosability; Fault isolation; Hierarchical assembly; Multivariate statistical analysis; Root cause analysis

Indexed keywords

FIXTURES (TOOLING); INSPECTION; PROCESS ENGINEERING; STATISTICAL METHODS;

EID: 0038379649     PISSN: 09206299     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1024453207632     Document Type: Review
Times cited : (38)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.