-
1
-
-
0035852776
-
-
Jung, H. T.; Coldren, B.; Zasadzinski, J. A.; Iampietro, D.; Kaler, E. W. Proc. Natl. Acad. Sci. U.S.A. 2001, 98, 1353.
-
(2001)
Proc. Natl. Acad. Sci. U.S.A.
, vol.98
, pp. 1353
-
-
Jung, H.T.1
Coldren, B.2
Zasadzinski, J.A.3
Iampietro, D.4
Kaler, E.W.5
-
2
-
-
0031932860
-
-
Denkov, N. D.; Yoshimura,H.; Kouyama,T.; Walz, J.; Nagayama, K. Biophys. J. 1998, 74, 1409.
-
(1998)
Biophys. J.
, vol.74
, pp. 1409
-
-
Denkov, N.D.1
Yoshimura, H.2
Kouyama, T.3
Walz, J.4
Nagayama, K.5
-
3
-
-
0001080760
-
-
Herve, P.; Roux, D.; Bellocq, A. M.; Nallet, F.; Gulik-Krzywicki, T. J. Phys. II (France) 1993, 3, 1255.
-
(1993)
J. Phys. II (France)
, vol.3
, pp. 1255
-
-
Herve, P.1
Roux, D.2
Bellocq, A.M.3
Nallet, F.4
Gulik-Krzywicki, T.5
-
5
-
-
0001349238
-
-
Israelachvili, J. N.; Mitchell, D. J.; Ninham, B. W. J. Chem. Soc., Faraday Trans. II 1976, 72, 1526.
-
(1976)
J. Chem. Soc., Faraday Trans. II
, vol.72
, pp. 1526
-
-
Israelachvili, J.N.1
Mitchell, D.J.2
Ninham, B.W.3
-
11
-
-
0001238795
-
-
Safran, S. A.; Pincus, P.; Andelman, D. Science 1990, 248, 354.
-
(1990)
Science
, vol.248
, pp. 354
-
-
Safran, S.A.1
Pincus, P.2
Andelman, D.3
-
12
-
-
0343603294
-
-
De Smet, Y.; Danino, D.; Deriemaeker, L.; Talmon, Y.; Finsy, R. Langmuir 2000, 16, 961.
-
(2000)
Langmuir
, vol.16
, pp. 961
-
-
De Smet, Y.1
Danino, D.2
Deriemaeker, L.3
Talmon, Y.4
Finsy, R.5
-
13
-
-
0343338086
-
-
Berclaz, N.; Mueller, M.; Walde, P.; Luisi, P. L. J. Phys. Chem. B 2001, 105, 1056.
-
(2001)
J. Phys. Chem. B
, vol.105
, pp. 1056
-
-
Berclaz, N.1
Mueller, M.2
Walde, P.3
Luisi, P.L.4
-
14
-
-
0037180428
-
-
Jung, H. T.; Lee, Y. S.; Kaler, E. W.; Coldren, B.; Zasadzinski, J. A. Proc. Natl. Acad. Sci. U.S.A. 2002, 99, 15318.
-
(2002)
Proc. Natl. Acad. Sci. U.S.A.
, vol.99
, pp. 15318
-
-
Jung, H.T.1
Lee, Y.S.2
Kaler, E.W.3
Coldren, B.4
Zasadzinski, J.A.5
-
15
-
-
0024426644
-
-
Kaler, E. W.; Murthy, A. K.; Rodriguez, B. E.; Zasadzinski, J. A. N. Science 1989, 245, 1371.
-
(1989)
Science
, vol.245
, pp. 1371
-
-
Kaler, E.W.1
Murthy, A.K.2
Rodriguez, B.E.3
Zasadzinski, J.A.N.4
-
16
-
-
33749435570
-
-
Kaler, E. W.; Herrington, K. L.; Murthy, A. K.; Zasadzinski, J. A. J. Phys. Chem. 1992, 96, 6698.
-
(1992)
J. Phys. Chem.
, vol.96
, pp. 6698
-
-
Kaler, E.W.1
Herrington, K.L.2
Murthy, A.K.3
Zasadzinski, J.A.4
-
18
-
-
0001270984
-
-
Brasher, L. L.; Herrington, K. L.; Kaler, E. W. Langmuir 1995, 11, 4267.
-
(1995)
Langmuir
, vol.11
, pp. 4267
-
-
Brasher, L.L.1
Herrington, K.L.2
Kaler, E.W.3
-
19
-
-
0027832103
-
-
Herrington, K. L.; Kaler, E. W.; Miller, D. D.; Zasadzinski, J. A.; Chiruvolu, S. J. Phys. Chem. 1998, 97, 13792.
-
(1998)
J. Phys. Chem.
, vol.97
, pp. 13792
-
-
Herrington, K.L.1
Kaler, E.W.2
Miller, D.D.3
Zasadzinski, J.A.4
Chiruvolu, S.5
-
20
-
-
0030568442
-
-
Yatcilla, M. T.; Herrington, K. L.; Brasher, L. L.; Kaler, E. W.; Chiruvolu, S. J. Phys. Chem. 1996, 100, 5874.
-
(1996)
J. Phys. Chem.
, vol.100
, pp. 5874
-
-
Yatcilla, M.T.1
Herrington, K.L.2
Brasher, L.L.3
Kaler, E.W.4
Chiruvolu, S.5
-
21
-
-
0034319433
-
-
Hao, J. C.; Hoffmann, H.; Horbaschek, K. J. Phys. Chem. B 2000, 104, 10144.
-
(2000)
J. Phys. Chem. B
, vol.104
, pp. 10144
-
-
Hao, J.C.1
Hoffmann, H.2
Horbaschek, K.3
-
22
-
-
0348245847
-
-
Horbaschek, K.; Hoffmann, H.; Hao, J. J. Phys. Chem. B 2000, 104, 2781.
-
(2000)
J. Phys. Chem. B
, vol.104
, pp. 2781
-
-
Horbaschek, K.1
Hoffmann, H.2
Hao, J.3
-
23
-
-
26144454657
-
-
submitted
-
McKelvey, C. A.; Hentze, H.-P.; Edlund, H.; Kaler, E. W.; Zasadzinski, J. A. Langmuir, submitted.
-
Langmuir
-
-
McKelvey, C.A.1
Hentze, H.-P.2
Edlund, H.3
Kaler, E.W.4
Zasadzinski, J.A.5
-
24
-
-
0023803129
-
-
Bellare, J. R.; Davis, H. T.; Scriven, L. E.; Talmon, Y. J. Electron Microsc. Tech, 1988, 10, 87.
-
(1988)
J. Electron Microsc. Tech
, vol.10
, pp. 87
-
-
Bellare, J.R.1
Davis, H.T.2
Scriven, L.E.3
Talmon, Y.4
-
25
-
-
0002557680
-
-
ACS Symposium Series; Herb, C. A., Prud'homme, R. K., Eds.; American Chemical Society: Washington, DC
-
Chiruvolu, S.; Naranjo, E.; Zasadzinski, J. A. In Microstructure of Complex Fluids by Electron Microscopy; ACS Symposium Series, Vol. 578; Herb, C. A., Prud'homme, R. K., Eds.; American Chemical Society: Washington, DC, 1994; p 86.
-
(1994)
Microstructure of Complex Fluids by Electron Microscopy
, vol.578
, pp. 86
-
-
Chiruvolu, S.1
Naranjo, E.2
Zasadzinski, J.A.3
-
28
-
-
33751554785
-
-
Szleifer, I.; Ben-Shaul, A.; Gelbart, W. M. J. Phys. Chem. 1990, 94, 5081.
-
(1990)
J. Phys. Chem.
, vol.94
, pp. 5081
-
-
Szleifer, I.1
Ben-Shaul, A.2
Gelbart, W.M.3
-
29
-
-
0000592715
-
-
Szleifer, I.; Kramer, D.; Ben-Shaul, A.; Gelbart, W. M.; Safran, S. A. J. Chem. Phys. 1990, 92, 5081.
-
(1990)
J. Chem. Phys.
, vol.92
, pp. 5081
-
-
Szleifer, I.1
Kramer, D.2
Ben-Shaul, A.3
Gelbart, W.M.4
Safran, S.A.5
-
33
-
-
35949014974
-
-
Safran, S. A.; Pincus, P. A.; Andelman, D.; MacKintosh, F. C. Phys. Rev. A 1991, 43, 1071.
-
(1991)
Phys. Rev. A
, vol.43
, pp. 1071
-
-
Safran, S.A.1
Pincus, P.A.2
Andelman, D.3
Mackintosh, F.C.4
-
37
-
-
0032070341
-
-
Fogden, A.; Carlsson, I.; Daicic, J. Phys. Rev. E 1998, 57, 5694.
-
(1998)
Phys. Rev. E
, vol.57
, pp. 5694
-
-
Fogden, A.1
Carlsson, I.2
Daicic, J.3
-
38
-
-
0038345827
-
-
note
-
c and f are related by a constant term independent of the vesicle curvature.
-
-
-
-
39
-
-
0038684349
-
-
note
-
The minimum ionic strength of these catanionic solutions is equal to the concentration of the minor surfactant component, and the maximum is the total surfactant concentration. For these experiments, the ionic strength ranges from about 10-100 mM. This leads to a Debye length of 1-10 nm (see Chapter 12 of ref 4), a small fraction of the average intervesicle spacing (as seen in the micrographs) of 75-100 nm. Hence, electrostatic interactions are negligible between the vesicles and the ideal mixing approximation is justified.
-
-
-
-
40
-
-
0000091997
-
-
Chiruvolu, S.; Israelachvili, J.; Naranjo, E.; Xu, Z.; Kaler, E. W.; Zasadzinski, J. A. Langmuir 1995, 11, 4256.
-
(1995)
Langmuir
, vol.11
, pp. 4256
-
-
Chiruvolu, S.1
Israelachvili, J.2
Naranjo, E.3
Xu, Z.4
Kaler, E.W.5
Zasadzinski, J.A.6
-
42
-
-
0025970192
-
-
Hallet, F. R.; Nickel, B.; Samuels, C.; Krygsman, P. H. J. Electron Microsc. Tech. 1991, 17, 459.
-
(1991)
J. Electron Microsc. Tech.
, vol.17
, pp. 459
-
-
Hallet, F.R.1
Nickel, B.2
Samuels, C.3
Krygsman, P.H.4
-
43
-
-
0028100184
-
-
Chiruvolu, S.; Warriner, H. E.; Naranjo, E.; Idziak, S.; Radler, J. O.; Plano, R. J.; Zasadzinski, J. A.; Safinya, C. R. Science 1994, 266, 1222.
-
(1994)
Science
, vol.266
, pp. 1222
-
-
Chiruvolu, S.1
Warriner, H.E.2
Naranjo, E.3
Idziak, S.4
Radler, J.O.5
Plano, R.J.6
Zasadzinski, J.A.7
Safinya, C.R.8
|