Local electromechanical properties and grain size effects in ferroelectric relaxors studied by scanning piezoelectric microscopy

Materials Research Society Symposium - Proceedings

Volumn 748, Issue , 2003, Pages 343-348

  Kholkin, A L ^a   Shvartsman, V V ^a   Woitas, M ^a   Safari, A ^b  

^a UNIVERSITY OF AVEIRO   (Portugal)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

GRAIN SIZE AND SHAPE; PHASE TRANSITIONS; PIEZOELECTRIC DEVICES;

SCANNING FORCE MICROSCOPY (SFM);

FERROELECTRIC MATERIALS;

EID: 0038375325     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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