In situ HREM observation of nucleation and growth of nanotwins beneath the solid-liquid interface in Si

Journal of Electron Microscopy

Volumn 52, Issue 1, 2003, Pages 79-84

  Arai, Shigeo ^a   Tsukimoto, Susumu ^a,b   Saka, Hiroyasu ^a  

^a NAGOYA UNIVERSITY   (Japan)

^b KYOTO UNIVERSITY   (Japan)

Author keywords

High pressure phase; HREM; In situ heating experiment; Nanotwins; Solid liquid interface

Indexed keywords

ARTICLE;

ALUMINUM COMPOUNDS; PHASE INTERFACES; SILICON; SILICON COMPOUNDS;

AL-SI LIQUID; HEATING EXPERIMENT; HIGH-PRESSURE PHASIS; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPES; IN SITU HEATING EXPERIMENT; IN-SITU HEATING; NANOTWINS; NUCLEATION AND GROWTH; SOLID-LIQUID INTERFACES; TRIPLE POINTS;

NUCLEATION;

EID: 0038373614     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/jmicro/52.1.79     Document Type: Article

References (6)

1. Sugawara S and Watanabe J (1993) Observation of melt growth process of Bi and Sn thin films. Microsc. Microanal. Microstruct. 4: 279-286.
2. Nishizawa H, Hori F, and Oshima R (2002) In-situ HRTEM observation of the melting-crystallization process of silicon. J. Cryst. Growth 236: 51-58.
3. Arai S, Tsukimoto S, Miyai H, and Saka H (1999) High-resolution insitu transmission electron microscopy observation of a solid-liquid interface in the Al-Si system. J. Electron Microsc. 48: 317-321.
4. Kamino T and Saka H (1993) A newly developed high resolution hot stage and its application to materials characterization. Microsc. Microanal. Microstruct. 4: 127-135.
5. Arai S, Tsukimoto S, Muto S, and Saka H (2000) Direct observation of the atomic structure in a solid-liquid interface. Microsc. Microanal. 6: 358-361.
6. Hu J Z, Merkle L D, Menoni C S, and Spain I L (1986) Crystal data for high-pressure phases of silicon. Phys. Rev. B 34: 4679-4684.