Characterization of epitaxial Pb(Zrx,Ti1-x)O3 thin films with composition near the morphotropic phase boundary

Materials Research Society Symposium - Proceedings

Volumn 748, Issue , 2003, Pages 399-404

  Saito, Keisuke ^a   Kurosawa, Toshiyuki ^a   Akai, Takao ^a   Yokoyama, Shintaro ^b   Morioka, Hitoshi ^b   Oikawa, Takahiro ^b   Funakubo, Hiroshi ^b  

^a PANalytical   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLOGRAPHY; EPITAXIAL GROWTH; LATTICE CONSTANTS; LEAD COMPOUNDS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; SINGLE CRYSTALS; X RAY DIFFRACTION ANALYSIS;

RECIPROCAL SPACE MAPPINGS (RSM);

THIN FILMS;

EID: 0038373353     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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