Domain structure and residual-strain characterization of epitaxial Pb(ZrxTi1-x)O3 thin films

IEEE International Symposium on Applications of Ferroelectrics

Volumn 2, Issue , 2000, Pages 913-916

  Saito, K ^a   Yamaji, I ^a   Akai, T ^a   Aratani, M ^a   Nagashima, K ^a   Funakubo, H ^a  

^a PHILIPS RESEARCH LABORATORIES   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; EPITAXIAL GROWTH; FERROELECTRIC MATERIALS; FILM PREPARATION; LATTICE CONSTANTS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; SEMICONDUCTING LEAD COMPOUNDS; SINGLE CRYSTALS; STRAIN; STRONTIUM COMPOUNDS; SUBSTRATES; X RAY DIFFRACTION ANALYSIS;

FERROELECTRIC THIN FILM; HIGH RESOLUTION X RAY RECIPROCAL SPACE MAPPING; LATTICE PARAMETERS CHARACTERIZATION; RESIDUAL STRAIN CHARACTERIZATION; SMALL ANGLE TILT ORIENTATION; WAVELENGTH DISPERSIVE X RAY FLUORESCENCE SPECTROMETER;

THIN FILMS;

EID: 0034470420     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)