Design of multilayer mirrors for XUV applications using simulated annealing

Journal De Physique. IV : JP

Volumn 104, Issue , 2003, Pages 243-246

  Graf, T ^a   Michette, A G ^a   Powell, A K ^a  

^a KING'S COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; INTERFACES (MATERIALS); MICROSCOPIC EXAMINATION; MIRRORS; OPTIMIZATION; SIMULATED ANNEALING; SURFACE ROUGHNESS; THERMAL EFFECTS; THICKNESS MEASUREMENT; ULTRAVIOLET RADIATION; X RAYS;

COMPUTATIONAL SUBLAYER THICKNESS; MULTILAYER MIRRORS;

OPTICAL MULTILAYERS;

EID: 0038363982     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:200300071     Document Type: Conference Paper

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