Optical and electrical properties of CuIn1-xGaxSe2 thin films obtained by selenization of sequentially evaporated metallic layers

Thin Solid Films

Volumn 431-432, Issue , 2003, Pages 200-204

  Caballero, R ^a   Guillen C ^a  

^a CIEMAT   (Spain)

Author keywords

CuIn1 xGaxSe2 thin films; Electrical properties; Optical properties

Indexed keywords

ELECTRIC CONDUCTIVITY OF SOLIDS; EVAPORATION; FILM GROWTH; METALLIC FILMS; OPACITY; THICKNESS MEASUREMENT; THIN FILMS; VAPOR DEPOSITION; X RAY DIFFRACTION ANALYSIS;

SELENISATION;

COPPER ALLOYS;

EID: 0038356656     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(03)00212-8     Document Type: Conference Paper

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