Transmission electron microscopy and image simulation study of CuAu domains in CuInS2 epitaxial layers

Thin Solid Films

Volumn 431-432, Issue , 2003, Pages 226-230

  Barcones, B ^a   Romano Rodriguez A ^a   Arbiol, J ^a   Alvarez Garcia J ^a   Perez Rodriguez A ^a   Morante, J R ^a   Scheer, R ^b  

^a UNIVERSITY OF BARCELONA   (Spain)

^b HAHN MEITNER INSTITUT   (Germany)

Author keywords

CuAu ordering; CuInS2; Epitaxial layer; Transmission electron diffraction

Indexed keywords

CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; ELECTRON DIFFRACTION; EPITAXIAL GROWTH; POLYCRYSTALLINE MATERIALS; TRANSMISSION ELECTRON MICROSCOPY; TWINNING;

CRYSTAL QUALITY; TRANSMISSION ELECTRON DIFFRACTION (TED);

COPPER COMPOUNDS;

EID: 0038356652     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(03)00162-7     Document Type: Conference Paper

References (5)

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3. Su D.S., Neumann W., Hunger R., Schubert-Bischoff P., Giersig M., Lewerenz H.J., Scheer R., Zeitler E. Appl. Phys. Lett. 73:1998;785.
4. Marcos-Ruzafa J., Romano-Rodríguez A., Álvarez-García J., Pérez-Rodríguez A., Morante J.R., Klaer J., Scheer R. Inst. Phys. Conf. Ser. 164:1999;247.
5. Barcones B., Romano-Rodríguez A., Álvarez-García J., Calvo-Barrio L., Pérez-Rodríguez A., Morante J.R., Scheer R., Klenk R., Luck I., Neisser A. Inst. Phys. Conf. Ser. 169:2001;507.