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Surface and Interface Analysis

Volumn 35, Issue 5, 2003, Pages 445-449

Surface analysis of plasma-treated polydimethylsiloxane by x-ray photoelectron spectroscopy and surface voltage decay

(2) Youn, Bok Hee a Huh, Chang Su a

a Inha University (South Korea)

Author keywords

PDMS; Surface voltage decay; Thermal activation energy; XPS

Indexed keywords

ELECTRIC CONDUCTIVITY; ELECTRIC CURRENTS; ELECTRIC DISCHARGES; ELECTRIC POTENTIAL; OXIDATION; PLASMA APPLICATIONS; SILICA; STRUCTURE (COMPOSITION); X RAY PHOTOELECTRON SPECTROSCOPY;

PLASMA TREATED POLYDIMETHYLSILOXANE; SURFACE ANALYSIS; SURFACE RESISTIVITY; SURFACE VOLTAGE; SURFACE VOLTAGE DECAY; THERMAL ACTIVATION ENERGY;

SILICONES;

EID: 0038353803 PISSN: 01422421 EISSN: None Source Type: Journal
DOI: 10.1002/sia.1558 Document Type: Article

Times cited : (8)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.