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Volumn , Issue , 2003, Pages 1295-1300

Automated assembly and packaging of hybrid optical modules

Author keywords

[No Author keywords available]

Indexed keywords

ASSEMBLY; AUTOMATION; COST EFFECTIVENESS; HERMETIC SEALS; MICROELECTRONIC PROCESSING; OPTICAL DESIGN; OPTICAL DEVICES; PHOTODIODES; SEMICONDUCTING SILICON; SEMICONDUCTOR LASERS;

EID: 0038350452     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (4)

References (8)
  • 1
    • 4243560300 scopus 로고    scopus 로고
    • Apparatus and method for mounting a laser to a substrate and aligning the laser with an optical conduit
    • Lucent Technologies Inc.; US Patent 5,721,797, Feb. 24
    • Basavanhally, N. R., Henein, G. E., Joyner, C. H., Koren, U., Lucent Technologies Inc., "Apparatus and Method for Mounting a Laser to a Substrate and Aligning the Laser with an Optical Conduit", US Patent 5,721,797, Feb. 24, 1998.
    • (1998)
    • Basavanhally, N.R.1    Henein, G.E.2    Joyner, C.H.3    Koren, U.4
  • 2
    • 4243584400 scopus 로고
    • Photonics module and alignment method
    • US Patent 5,023,881, June. 11
    • Ackerman, D. A., Blonder, G.E., Mac Donald, W.M., "Photonics Module and Alignment Method", US Patent 5,023,881, June. 11, 1991.
    • (1991)
    • Ackerman, D.A.1    Blonder, G.E.2    Mac Donald, W.M.3
  • 4
    • 0002547124 scopus 로고
    • The Au-Sn(Gold-Tin) system
    • ASM International, Metals Park, Ohio
    • Okamoto, H., Massalski, T. B., "The Au-Sn(Gold-Tin) System", in Phase diagram of binary gold alloys, p. 278-289, ASM International, Metals Park, Ohio, (1987).
    • (1987) Phase Diagram of Binary Gold Alloys , pp. 278-289
    • Okamoto, H.1    Massalski, T.B.2
  • 5
    • 0017629462 scopus 로고
    • Interdiffusion and phase formation at room temperature in evaporated Gold-Tin films
    • Buene, L. "Interdiffusion and Phase Formation at Room Temperature in Evaporated Gold-Tin Films", Thin Sol. Films 47, (1977), pp. 159.
    • (1977) Thin Sol. Films , vol.47 , pp. 159
    • Buene, L.1
  • 8
    • 0004022147 scopus 로고    scopus 로고
    • MIL-STD-883E; Department of Defense, USA
    • MIL-STD-883E, Test Method Standard Microcircuits, Department of Defense, USA, (1996),.
    • (1996) Test Method Standard Microcircuits


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.