A model of the backside illuminated Chandra CCD

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4851, Issue 1, 2002, Pages 149-156

  Prigozhin, Gregory ^a   Bautz, Mark ^a   Ricker, George ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Charge coupled device; Charge transfer inefficiency; Electron traps; X ray

Indexed keywords

CHARGE COUPLED DEVICES; ELECTRON TRAPS; MONTE CARLO METHODS; OBSERVATORIES; SEMICONDUCTING SILICON;

CHARGE TRANSFER INEFFICIENCY;

X RAY SPECTROMETERS;

EID: 0038295857     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.461428     Document Type: Conference Paper

References (9)

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