Calibration of X-ray CCDs with an erect-field grating spectrometer in the 0.2 - 1.5 keV band.

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2808, Issue , 1996, Pages 260-270

  Prigozhin, G ^a   Bautz, M ^a   Gendreaut, K ^b   Ricker, G ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^b NASA GODDARD SPACE FLIGHT CENTER   (United States)

Author keywords

charge coupled devices (CCD); X ray absorption fine structure (XAFS); X ray spectrometers; X rays

Indexed keywords

ABSOLUTE DISPERSION; CONTINUOUS FUNCTIONS; GRATING SPECTROMETERS; HIGH-RESISTIVITY SUBSTRATE; NEAR EDGE STRUCTURE; SPECTRAL RESPONSE FUNCTIONS; SYNCHROTRON RADIATION SOURCE; X RAY ABSORPTION FINE STRUCTURES;

ASTRONOMY; CHARGE COUPLED DEVICES; DISPERSIONS; GAMMA RAYS; OXYGEN; X RAYS;

SPECTROMETERS;

EID: 0010059558     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.256000     Document Type: Conference Paper

References (8)

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